Analysis of a sample by powder XRD provides important information that is complementary to various microscopic and spectroscopic methods, such as phase identification, sample purity, crystallite size, and, in some cases, morphology. By analyzing the XRD peak pattern, one can: identify and quantify crystalline phases, calculate residual stress (macrostrain) in the material from measured lattice parameters, characterize the crystallite size and microstrain from peak broadening effects, and map the measured lattice parameters in reciprocal space to analyze pseudo-morphic growth of epitaxial films.Īdditionally, advanced modeling can be performed from high-resolution XRD data to obtain layer composition and thickness information for epitaxial films, and rocking-curves procedures can be used to show the quality of the films. X-ray diffraction (XRD) is a rapid analytical technique used for quantitative or qualitative determination of crystalline phases (where >1. Powder X-ray diffraction (XRD) is a common characterization technique for nanoscale materials. Various options and output formats to create publication-quality graphs. It can be used for phase identification, phase quantification, structure refinement, and export of results and graphs to tables and figures. The XRD system scans over a range of diffraction angles, yielding diffraction peaks that can be correlated to distinct families of atomic planes in crystalline specimens. Profex is a graphical user interface for Rietveld refinement of powder X-ray diffraction (XRD) data with the program BGMN. X-ray diffraction results when an monochromatic, collimated X-Ray beam strikes a crystalline sample and the lattice spacings between atomic planes produce constructive interference with the incident beam at specified angles, in accordance with Bragg’s Law.
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